International Journal of Electronics and Microcircuits
  • Printed Journal
  • Refereed Journal
  • Peer Reviewed Journal

P-ISSN: 2708-4493, E-ISSN: 2708-4507

2022, Vol. 2, Issue 2, Part A


S. No. Title and Authors Name
1
Blockchain for mobile cellular networks: Recent advances and future use
Akash R
Int. J. Electron. Microcircuits, 2022; 2(2): 01-07
Abstract  |  Download  |  Country: India  |  File Size: 148 KB  |  Views: 1142   Downloads: 802
2
AI safety: Public attitudes and necessity for next generation secure communication
Samridh Anand Paatni
Int. J. Electron. Microcircuits, 2022; 2(2): 08-12
Abstract  |  Download  |  Country: India  |  File Size: 130 KB  |  Views: 531   Downloads: 181
3
Real time ray tracing in modern 3d video games
K Rishie Kumaaran
Int. J. Electron. Microcircuits, 2022; 2(2): 13-17
Abstract  |  Download  |  Country: India  |  File Size: 165 KB  |  Views: 524   Downloads: 190
4
High speed data transmission through optical fiber of 1550 Nm InGaAsP/InP MQW semiconductor laser
Dr. Manoj Kumar Mittal
Int. J. Electron. Microcircuits, 2022; 2(2): 18-23
Abstract  |  Download  |  Country: India  |  File Size: 305 KB  |  Views: 627   Downloads: 281
5
Development of solar thermal power generation using particle swarm optimization
Olawuni Adeolu, Bello Saheed A and Adesina Morenikeji Dele
Int. J. Electron. Microcircuits, 2022; 2(2): 24-32
Abstract  |  Download  |  Country: Nigeria  |  File Size: 303 KB  |  Views: 603   Downloads: 266
6
On optimization of manufacturing of a current follower transconductance amplifier based on heterostructures to increase density of their elements. Influence of miss-match induced stress
EL Pankratov
Int. J. Electron. Microcircuits, 2022; 2(2): 44-64
Abstract  |  Download  |  Country: Russia  |  File Size: 878 KB  |  Views: 465   Downloads: 171
7
Study of electron chargÑ–ng effects Ñ–n semÑ–-conductor quantum dots
Archana Kumari
Int. J. Electron. Microcircuits, 2022; 2(2): 65-68
Abstract  |  Download  |  Country: India  |  File Size: 591 KB  |  Views: 326   Downloads: 149
International Journal of Electronics and Microcircuits
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