International Journal of Electronics and Microcircuits
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P-ISSN: 2708-4493, E-ISSN: 2708-4507

2021, Vol. 1, Issue 1, Part A


On increasing of integration rate of field-effect hetero-transistors framework a comparator in latch state


Author(s): EL Pankratov

Abstract: In this paper we introduce an approach to increase integration rate of elements of the comparator in latch state. Framework the approach we consider a hetero-structure with special configuration. Several specific areas of the hetero-structure should be doped by diffusion or ion implantation. Annealing of dopant and/or radiation defects should be optimized.

Pages: 01-21 | Views: 692 | Downloads: 305

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International Journal of Electronics and Microcircuits
How to cite this article:
EL Pankratov. On increasing of integration rate of field-effect hetero-transistors framework a comparator in latch state. Int J Electron Microcircuits 2021;1(1):01-21.
International Journal of Electronics and Microcircuits
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